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12V 共漏极双 N 沟道 MOSFET,AOCR33105E
新型 AOCR33105E 采用最新沟槽功率 MOSFET 技术设计,共漏极结构,简化客户设计。 它具有超低导通电阻和 ESD 保护,可提高保护开关和移动电池充电和放电电路等电池管理的性能和安全性。作为首颗应用MRigidCSP™ 新型封装技术,实现在降低导通电阻的同时提高CSP ...
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