Field ion microscope - Wikipedia
The field-ion microscope (FIM) was invented by Müller in 1951. [1] It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
Field Ion Microscopy - an overview | ScienceDirect Topics
Field Ion Microscopy is a technique in materials science that allows for the observation of individual atoms with true atomic resolution using a field ion microscope. It involves the controlled evaporation of atoms from a specimen's surface to reveal atomic scale structures.
场离子显微镜 - 百度百科
FIM(Field Ion Microscope)是最早达到 原子分辨率 ，也就是最早能看得到原子尺度的显微镜。只是要用FIM看像，样品得先处理成针状，可不是粗针、细针都行喔，针的末端曲率半径约在200~1000埃。
场离子显微术_百度百科
在样品加上足够高的电压时，气体原子发生极化和电离，荧光屏上即可显示尖端表层原子的清晰图像，图象中每一个亮点都是单个原子的像 [2]。. 场离子显微术 (Field Ion Microscopy,FIM) 是于1951 年由Muller 所发明，其前身乃场发射显微术 (Field EmissionMicroscopy,FEM)。. FEM在 ...
Field Ion and Field Desorption Microscopy: Principles and Applications ...
The chapter describes the basic principles of the field ion (FIM) and field desorption (FDM) microscopies and of the probe-hole spectroscopic analysis of imaging species, as well as their applications for the studying of dynamic surface processes on the atomic scale....
Field Ion Microscopy - an overview | ScienceDirect Topics
Field ion microscopy (FIM) is one of the early steps leading to the development of atom probe tomography (APT). It shares with APT the necessity of an extremely intense electric field at the specimen surface, and most of the projection laws necessary to interpret collected data.
Basics of Field Ion Microscopy - ScienceDirect
2016年1月1日 — Field ion microscopy (FIM) is one of the early steps leading to the development of atom probe tomography (APT). It shares with APT the necessity of an extremely intense electric field at the specimen surface, and most of the projection laws necessary to …
Field Ion Microscopy - SpringerLink
The field ion microscope, invented by Müller [4.1] in 1951, was the first instrument to reveal surfaces on the atomic level. In the years since its invention, the field ion microscope and its derivatives have proved not only remarkably simple, but also versatile, allowing important new insights about atomic behavior in many different fields of ...
Field Ion Microscopy - SpringerLink
2012年1月1日 — Field ion microscopy, often referred to as FIM, provides atomic-resolution imaging of the surface of a specimen. A rare gas, called the imaging-gas, is introduced in the vicinity of a positively charged sharp needle.
场离子显微镜(FIM)及其应用 - 百度学术
本文着重介绍场离子显微镜 (Field Ion Microscope)的分辨率、放大倍数、离子像的强度、沟道板像增强器、场离子像的形成以及场离子显微镜 (FIM)和原子探针场离子显微镜 (APFIM)的简单结构与原理。. 同时还介绍了FIM在固体表面研究中的应用。. 关键词：. 场离子显微镜 ...