X-Ray Fluorescence Spectroscopy (XRF) – Basics
The energy dispersive X-ray fluorescence spectroscopy (XRF) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems.
Trace Element Analysis - XRF Spectroscopy
The analysis of trace elements places highest demands on the measuring technology. From measurements of heavy metals in toys to tests for origin and genuineness of gemstones – FISCHER offers the right solution for trace analysis as well.
RoHS Screening with XRF - XRF Spectroscopy
RoHS Screening with XRF. Legal regulations, like RoHS, REACH, WEEE, EOLV and CPSIA restrict the use of hazardous materials for example in electronics products, toys or packaging. FISCHER offers proven solutions for fast RoHS screening. The samples are not destroyed and do not need to be prepared extensively. For example, the critical chemical ...
Impressum - XRF Spectroscopy
High performance X-ray fluorescence measuring instrument with vacuum chamber for non-destructive material analysis
Handheld/Mobile XRAY Survey - XRF Spectroscopy
High performance X-ray fluorescence measuring instrument with vacuum chamber for non-destructive material analysis
Kontakt | XRF Spectroscopy
High performance X-ray fluorescence measuring instrument with vacuum chamber for non-destructive material analysis
Datenschutzbestimmungen | XRF Spectroscopy
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